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Peter C. Doerschuk

Applied Physics and Engineering

Cornell University

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About Peter C. Doerschuk at Cornell University (Cornell)

Peter C. Doerschuk is a researcher at Cornell University specializing in digital twin technologies and machine learning applications for advanced nanofabrication and semiconductor manufacturing. Doerschuk has established a strong presence in the field. Their research directions are illustrated by key works including "Review of machine learning for lipid nanoparticle formulation and process development", and "Double U-Net based Virtual Metrology on Plasma-Etch CD-SEM Images : AM: Advanced Metrology".

Research Areas

digital twinsnanofabricationmachine learningsemiconductor manufacturingelectron microscopyprocess modelingadvanced spectroscopybacteriophages

Academic Impact Matrix

Research output metrics for Peter C. Doerschuk aggregated from public academic databases. Student lab experience data is pending.

Academic data verified · April 2026 · Next sync: May 2026

Research Output

Total Citations1,628

Emerging researcher

Publications186

Active researcher

h-index21

Developing track record

i10-index36

Growing portfolio

Lab Environment

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Top Publications

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